O Series XRF

The O Series combines high performance with a small x-ray spot size. This is made possible by the poly-capillary focusing optics system that replaces the collimator assembly installed in standard Bowman systems. The optics are designed to focus the x-rays coming from the tube exit window to a very small spot size (80μm FWHM) while retaining virtually 100% of the tube flux. So instead of attenuating the x-rays that can't fit through the small apertures, as is the case with collimator systems, the poly-capillary optics assembly allows almost all of the x-rays from the tube to reach the sample. The result is much greater sensitivity for testing very small components or thin coatings. Shorter test times can achieve even better repeatability when comparing optics systems vs. a similar sized collimator.

The standard configuration includes the 80μm optics, along with a high resolution SDD detector that can process the higher count rates. The camera has a greater magnification compared to other models like the P Series, with a 45x video magnification and 5x higher digital zoom. A programmable X-Y sample stage is also standard. The optics system has a very close focal distance, so O Series samples must be flat.

Now available with extended stage option

The O Series XRF is best suited to customers with these requirements:

  • Very small parts/features such as semiconductors, connectors, or PCBs
  • Requirements to test many samples or locations per new lot of material
  • Need to measure very thin coatings (<100nm)
  • Very short measurement times (1-5 seconds)
  • Guaranteed to meet IPC-4552A, 4553A, 4554 and 4556
  • ASTM B568, DIN 50987 and ISO 3497

Application Performance

  ENEPIG Electroless Nickel
  μm Au μm Pd μm Ni μm NiP μm %P
Ave 0.0427 0.08 3.72 10.2015 10.17
StdDev 0.00045 0.0009 0.000985 0.1089 0.29
Range 0.0015 0.003 0.0395 0.3863 0.99
%RSD 1.053% 1.121% 0.265% 1.067% 2.85%