TEM Sample Preparation - Cross Section Kit Ideal for preparing cross sectional transmission electron microscopy (XTEM) samples of semiconductor devices, thin films of various substrates, and composites. Advantages ... Labpol 12 - Advanced Grinder/ Polisher EXTEC ® Labpol 12 - Advanced Grinder/Polisher 1.0 Catalog# 10451, 10454 Extec Labpol 12 1.0 Advanced Automatic Grinding/Polishing Machine With Central Pressure Head. Se... Reliability Testing - Burn In System for HTRB, H3TRB,IOL, HTOL - Vcsel Reliability Testing - LED Reliability Testing - Transistor Reliability Testing - Drift Voltage Monitoring System Auto Decap Function & Features All the works necessary for decap are realized through Auto Decaper. The automated robot decapsulation system that has been developed first in... Mill Etch Function & Features Using End mill for the milling of EMC Fast, safe, and accurate milling work Prompt and accurate milling by robot motions (Average mill... Wet Etch Function & Features Automatic chemical decapsulation equipment The functions of etching, heating, acetone cleaning, and drying available Protecting worker... Laser Decap Function & Features Automatic laser decapsulation system All types of semiconductor package can be removed Any material(Au, Cu, Al) of wire part and 2nd b... Hot Chuck Our hot chucks are capable of heating your device under test up to 700°C. Our selection ranges depending on chuck size and maximum required temperature for your experiments. ... Four Point Probe SR-4 Everbeing’s four point probe uses the four co-linear probes on contact to determine the sheet resistance of your wafer or thin films. The method uses the four terminal ... Solarus II Plasma Cleaner The next-generation plasma tool to remove hydrocarbon contamination from TEM and SEM samples and holders. Advantages This system is ideal for researchers who want to reproducib... Dimple Grinder Fast and reliable mechanical method of pre-thinning to near electron transparency to greatly reduce your ion milling times and uneven thinning. Advantages Large transparen... PIPS II Precision ion polishing system for precise centering, control, and reproducibility of your milling process. Advantages X,Y stage permits alignment of argon beams to regio... Ilion II Ideal for low energy surface preparation for your SEM cross section viewing. Advantages Fully automated argon ion polishing system suitable for preparation of SEM samples to pr... PECS II Broad argon ion beam system designed to polish and coat samples for SEM imaging and analytical techniques. Advantages Fully automated argon ion polishing system suitable ... Cutting Machine - Labcut 300 The Extec Labcut® 300A Advanced Abrasive Cutting Machine is a bench top model with a high efficiency torque driven motor which is manually operated and... Q150R Plus - Rotary Pumped Coater Q150R Plus - Rotary Pumped Coater The Q150R Plus is suitable for use with Tungsten/LaB6 SEM and Benchtop SEM. Typical uses: Sputter coating of n... Pegasus Pegasus 2-pin ESD Test System The Thermo Scientific™ Pegasus™ ESD Test System is a low parasitic 2-pin tester which is used to characterize protection structures at ... Celestron Celestron™ TLP/VF-TLP Test System The Thermo Scientific™ Celestron™ TLP/VF-TLP Test System can be configured for both Standard TLP and VF-TLP for testing at th... Orion 3 Orion3™ Charged Device Model (CDM) tester The Thermo Scientific™ Orion3™ is designed to test for potentially destructive effects of ESD, enabling the identific... MK1 MK.1TE ESD and Static Latch-up Test System The Thermo Scientific™ MK.1TE ESD and Static Latch-up Test System provides users with advanced capabilities to test midrange pin... MK2 MK.2TE ESD and Latch-up Test System The Thermo Scientific™ MK.2TE ESD and Latch-up Test System provides users with advanced capabilities to test high pin count devices to ... MK4 MK.4TE ESD and Latch-Up Test System Thirty years in the making - IC structure designers and QA program managers in manufacturing and test house facilities worldwide have embrace... Thermal HS Infrared Hot Spot Detection Microscopy A traditional approach to finding shorts in semiconductor devices has been liquid crystal investigation. Unfortunately, liquid crystal investigations have several limitations: low ... XIVA™ LSIM ( Laser Signal Injection Microscopy) XIVATM LSIM (Laser Signal Injection Microscopy) is used to locate shorts, junction defects, problem VIAs and other integrated circuit defects. XIVATM works by scann... Emmi™ Photoemission Microscopy QFI owns the original patent on the photoemission technique; emmiTM is a trademark on QFI’s photoemission microscopy systems. Photoemission solutions are tar... C2 Mini Probe Station Probe Station 2″ Chuck Coaxial Stage X-Y Travel 2″x2″ Vacuum Chuck Chuck Theta 15 Degrees 320 mm x 320 mm Base Catalogue Here C series - Starter Probe Station Probe Station Coaxial Stage X-Y Travel Vacuum Chuck Chuck Theta 30 Degrees Available in 4″, 6″ Chuck Size Catalogue Here BD Series Probe Station Coaxial Stage X-Y Travel Vacuum Chuck Chuck Theta 30 Degrees Microscope Mount X-Y Travel Platen Up/Down (Coarse and Fine Adjust) Available in 6″... EB Series Probe Station Coaxial Stage X-Y Travel Coaxial Up/Down Vacuum Chuck Chuck Theta 30 Degrees Microscope Mount X-Y Travel Available in 4″, 6″, 8″, 12... Labpol 8-12 S advanced Polisher EXTEC ® Labpol 8-12S - Advanced Convertible Grinder/Polisher Catalog# 10261 Extec ® Labpol 8-12S Advanced Convertible Grinder/Polisher (110v) with Semi-automatic he... Labpol Duo 8 Polisher EXTEC ® Labpol Duo 8 - Twin Grinding/Polishing Machine Catalog# 10248 EXTEC LABPOL 8" (203mm) Duo Twin Grinding/Polishing Machine. Variable speed 50-500rpm Labpol 8-12 M advanced Polisher EXTEC ® Labpol 8-12M - Advanced Convertible Grinder/Polisher Catalog# 10260 The Extec Labpol 8-12 Advanced Convertible Grinder/Polisher is a versatile compact convertib... Cutting Machine - Labcut 150 EXTEC Labcut® 150 - Variable Speed Precision Diamond Saw Catalog# 10150 EXTEC LABCUT® 150 Variable Speed, 3" - 6", includes: 10015 Screw Holder for i... Mini Sputter Coater SC7620 The SC7620 is a compact entry-level SEM sputter coater. When combined with the optional SC7620-CF carbon fibre evaporation attachment it makes the ideal low-cost SEM sputterin... Smartproof 5 Your Integrated Widefield Confocal Microscope for Surface Analysis in Quality Assurance and Quality Control The versatile ZEISS Smartproof 5 widefield confocal microscope is you... Smartzoom 5 Your Automated Digital Microscope for Routine and Failure Analysis Smart Design. Smart Workflow. Smart Output. ZEISS Smartzoom 5 is your smart digital microscope - ideal for ... Stemi 508 Greenough Stereo Microscope with 8:1 Zoom Your Compact, Reliable Greenough Stereo Microscope For Excellent Image Contrast and Color Accuracy Equipped with apochromatic opt... Axio Imager Vario Upright Microscope for Large Samples Examine large samples – automated and clean room compatible Analyze smallest MEMS sensors up to XXL wafer or even entire flat plane... Axio Imager 2 Your Motorized Microscope Platform Your Microscope System for Advanced Materials Research Introduce ease of operation into your microscopy workflow - Axio Imager 2 ensures ac... Axioscope Your Microscope for Research and Routine in the Materials Lab Turnkey solution for materials research and metallography Reliable results thanks to advanced light ... FF35 CT High Resolution Industrial CT System for Small/Medium-Sized Parts Inspection The YXLON FF35 CT computed tomography system is designed to achieve extremely precise inspection res... L Series XRF The L Series is Bowman’s most versatile instrument. It combines all of the features of the P Series with a larger sample chamber and greater X-Y stage travel. For sample... M Series XRF The M Series is the ultimate in high performance plating thickness measurements for the smallest features. The poly-capillary optics in the M Series is more advanced than the&... O Series XRF The O Series combines high performance with a small x-ray spot size. This is made possible by the poly-capillary focusing optics system that replaces the collimator assembly i... P Series XRF The P series offers the flexibility of measuring a wide variety of sample sizes, shapes, and quantities. It is equipped with a high precision programmable X-Y stage that offer... B Series XRF The B Series is the most basic top-down measurement configuration. The sample stage is a fixed base plate; operators manually position parts in the desired area for testing. T... G Series XRF The G Series’ two most distinctive features are precision video imaging, and 'bottom-up' measurement using a motorized Z-axis with laser-based auto-focus. The la... Cheetah EVO Best-in-class scalable X-ray inspection systems for assembly and laboratory applications. The YXLON Cheetah EVO series was designed to provide the "best-in-class" insp... Cougar EVO Scalable small footprint X-ray inspection systems for assembly and laboratory applications The YXLON Cougar EVO series was designed to provide the "best-in-class" insp... FF70 CL Highest resolution advanced 2D and 3D X-ray system for fully automated analysis of the smallest features Semiconductor manufacturing requires automated, high-quality, reliable, ... FF20 CT High Resolution Industrial CT System for Fine Parts Inspection The YXLON FF20 CT computed tomography system is designed to achieve the best 3D inspection results at very high re... Stemi 305 Compact Greenough Stereo Microscope Stemi 305 is your compact Greenough stereo microscope with 5:1 zoom for biological education, labs and industrial production environments. Ob... Videos More... Yxlon Cougar ECO and Cheetah ECO Launch at Nepcon Thailand YXLON CT Metrology Bowman - Precision XRF Coating Measurement Systems News & Events More... EMAX EXHIBITION 2019 Date: Jul 17, 2019 - Jul 19, 2019 Yxlon Cougar ECO and Cheetah ECO Launch at Nepcon Thailand Date: Jun 20, 2019