B Series XRF

The B Series is the most basic top-down measurement configuration. The sample stage is a fixed base plate; operators manually position parts in the desired area for testing. This is accomplished by placing parts into the chamber and using the video image to align the desired location within the crosshairs on the screen. The sample chamber is the same as the P Series, with the slotted configuration, but without the programmable X-Y sample stage.

The standard configuration includes a single fixed collimator; the camera has a fixed focal distance. The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. As with all Bowman benchtop XRFs, instruments can be upgraded to include multiple collimators, a variable focal camera, or an SDD detector.

The B Series XRF is best suited to customers with these requirements:

  • Relatively low testing volume requirements
  • Larger samples that require one test location per part
  • Large PCBs that require simple spot checks per lot of new material
  • Budget restrictions with option to upgrade components later
  • Guaranteed to meet IPC-4552A, 4553A, 4554 and 4556
  • ASTM B568, DIN 50987 and ISO 3497