PRODUCTS

Electrical probing (failure analysis)

A simple task in the world of electronics is the measurement of an I-V curve of a single transistor. However, if the size of the transistor is reduced to a few hundred nanometres, this task becomes very challenging. Probing on small structures requires high positioning accuracy and a very stable probing system. Our probing solutions exceed the necessary requirements, providing you with a fast and simple system to effectively increase your probing throughput.

In-situ lift-out

Sample preparation is a necessary prerequisite for transmission electron microscopy (TEM). The advent of focused ion beam (FIB) workstations for the preparation of electron transparent lamellae has revolutionized TEM specimen preparation. An advanced analytical tool combined with a high-precision nanomanipulation system gives you the benefit of sample preparation techniques that are faster, more accurate.

Ex-situ lift-out

Sample preparation is a necessary prerequisite for transmission electron microscopy (TEM), but it can be time consuming and costly. The procedure for transferring the lamella to the TEM grid can be performed faster outside the focused ion beam (FIB) by making use of a light microscope and a highly stable and precise micromanipulator. The time required for preparation of the specimen can thus be reduced and the expensive use of the FIB can also be saved.

A New Dimension in Raman Microscopy: Ultra-fast & high resolution chemical imaging

The confocal Raman microscope alpha300 R offers the unique ability to acquire chemical information non-destructively with a resolution down to the optical diffraction limit (~ 200 nm). This allows you to observe and analyze the distribution of different phases within a sample in ambient conditions without specialized sample preparation. Because of the confocal setup, it is not only possible to collect information from the sample surface, but also to look deep inside transparent samples and even obtain 3D information.

High-Performance User-Friendly Atomic Force Microscope for Materials Research, Life Sciences and Nanotechnology.

The alpha300 A integrates an AFM system with a scientific grade optical microscope for superior optical access and high-resolution sample survey. The inclusion of a special AFM objective allows simultaneous cantilever and sample observation, which provides precise cantilever positioning and rapid alignment. The user-friendliness and versatility of this composite system can benefit an enormous variety of scientific endeavors.